Abstract
Extreme learning machine (ELM) and evolutionary ELM (E-ELM) were proposed as a new class of learning algorithm for single-hidden layer feedforward neural network (SLFN). In order to achieve good generalization performance, E-ELM calculates the error on a subset of testing data for parameter optimization. Since E-ELMemploys extra data for validation to avoid the overfitting problem, more samples are needed for model training. In this paper, the cross-validation strategy is proposed to be embedded into the training phase so as to solve the overtraining problem. Based on this new learning structure, two extensions of E-ELM are introduced. Experimental results demonstrate that the proposed algorithms are efficient for image analysis.
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Liu, N., Wang, H. Evolutionary Extreme Learning Machine and Its Application to Image Analysis. J Sign Process Syst 73, 73–81 (2013). https://doi.org/10.1007/s11265-013-0730-x
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DOI: https://doi.org/10.1007/s11265-013-0730-x