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Peering through a glass darkly

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International Commerce Review

Abstract

We all know RFID is going to change our industry. But we don’t know how much, or how soon. To make robust investment decisions we need a better understanding of new technologies’ evolutionary journeys.

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Authors and Affiliations

  1. Stanford, USA

    Hau L. Lee

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  1. Hau L. Lee
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Correspondence to Hau L. Lee.

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Lee, H.L. Peering through a glass darkly. International Commerce Review 7, 60–68 (2007). https://doi.org/10.1007/s12146-007-0010-4

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  • DOI: https://doi.org/10.1007/s12146-007-0010-4

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