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Evaluation of Measurement Uncertainty for Absolute Flatness Measurement by Using Fizeau Interferometer with Phase-Shifting Capability

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Abstract

It is important to precisely measure flatness of the optical flats, as many industries use these as reference standards to ensure the quality of precision measurements and fabricated components. This paper describes identification of sources of error and measurement uncertainty evaluation for three flat test. Three flat test is used for absolute flatness measurement of optical flats, with the help of Fizeau interferometer (VerifireXP/D, with phase shift interferometry) established recently at National Physical Laboratory, India (NPL-I). The absolute profile of reference flat with higher accuracy can be determined using liquid level reference but liquid flat reference is more difficult to realize practically. Therefore three flat test is frequently adopted in standard interferometric measurements and traceability of this test can also be established by using a traceable laser head. This paper describes three flat method in detail along with observations and evaluation of measurement uncertainty as per ISO GUM is also done. Factors contributing to uncertainty of measurement of surface flatness have been indentified and detailed evaluation of uncertainty in measurements has been reported here.

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References

  1. D. Malacara, M. Servin and Z. Malacara, Interferogram analysis for optical testing. Marcel Dekker, New York (1998). Copyright 2005 by Taylor and Francis.

  2. M. F. Küchel, A new approach to solve the three flat problem, Opt.-Int. J. Light Electron Optics, 112 (2001) 381–391.

  3. C. Xu, L. Chen and J. Yin, Method for absolute flatness measurement of optical surfaces. Appl. Optics, 48 (2009) 2536–2541.

  4. http://www.veeco.com/pdfs/appnotes/an506-absolute_05083_352.pdf.

  5. NBSIR 75-975- The calibration of an optical flat by interferometric comparison to a master optical flat.

  6. M. Bahrawi, N. Farid, Application of a commercially available displacement measuring interferometer to line scale measurement and uncertainty of measurement, MAPAN-J. Metrol. Soc. India, 25 (2010) 259–264.

  7. Y. Bitou, T. Takatsuji and K. Ehara, Simple uncertainty evaluation method for an interferometric flatness measurement machine using a calibrated test flat, Metrologia, 45 (2008) 21–26.

    Article  ADS  Google Scholar 

  8. http://photonics.intec.ugent.be/education/ivpv/res_handbook/v2ch21.pdf.

  9. D. Bhattacharyya, A. Ray, B.K. Dutta and P.N. Ghosh, Direct measurement on transparent plates by using FIZEAU interferometry, Optics Laser Technol., 34 (2002) 93–96.

    Article  ADS  Google Scholar 

  10. GPI & Verifire operating manual OMP-0545F, Copyright 2009 by Zygo Corporation, USA.

  11. P. Hariharan, B.F. Oreb and T. Eiju, Digital phase shift interferometry: simple error-compensating phase calculation algorithm, Appl Optics, 26 (1987) 2504–2506.

  12. A.J. Damião, F.D. Origo, M.W. Ribeiro, and M.A. Fogarin Destro, Optical flats and optical parallels calibrated by interferometry, METROSUL IV (IV Metrology Latin American congress), Fozdo, Iguagu, Brazil (2005).

  13. GPI three flat application manual 0387_B note, Zygo Corporation, USA.

  14. U. Griesmann, Q. Wang and J. Soons, Three flat tests including mounting-induced deformations, Opt. Eng., 46 (2007) 093601.

  15. V. Greco, R. Tronconi, C. Del Vecchio, M. Trivi and G. Molesini, Absolute measurement of planarity with Fritz’s method: uncertainty evaluation, Appl. Optics, 38 (1999) 2018–2027.

  16. A.J. Damião, F.D. Origo, M.A.F. Destro, M.W Ribeiro and R.A. Stempniak, Optical surfaces flatness measurements using the three flat method, XXVI ENFMC—Ann. Optics, 5 (2003).

  17. Three flat test application note, Zygo’s reference manual.

  18. K.P. Chaudhary, C. Shakher and K. Shashi, Measurement of the size and spacing of standard wire sieves using an image processing system and wavelet transform, MAPAN-J. Metrol. Soc. India, 26 (2011) 15–27.

  19. K.P. Chaudhary, R. Sharma, F. Niveen and R.P. Singhal, Calibration of step gauge by substitution method on coordinate measuring machine and evaluation of uncertainty of measurement, MAPAN-J. Metrol. Soc. India, 17 (2002) 63–74.

    Google Scholar 

  20. R. Sharma, K.P. Chaudhary, A.K. Kanjilal and V.G. Kulkarni, Estimation of uncertainty in measurement: application of ISO guidelines in case of measurements and calibration using laser interferometers, MAPAN-J. Metrol. Soc. India, Suppl. Issue 1 (2001)

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Acknowledgments

The authors would like to thank Prof. R. C. Budhani, Director, CSIR- National Physical Laboratory, New Delhi for his constant encouragement and support for this work. The Authors also acknowledge the financial support from CSIR.

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Correspondence to Girija Moona.

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Moona, G., Sharma, R., Kiran, U. et al. Evaluation of Measurement Uncertainty for Absolute Flatness Measurement by Using Fizeau Interferometer with Phase-Shifting Capability. MAPAN 29, 261–267 (2014). https://doi.org/10.1007/s12647-014-0106-0

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