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Structure and electrical studies on nanostructured ZnTe thin films

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Abstract

Nanostructured ZnTe thin films on glass substrate were obtained by using a thermal evaporator. Structure, topography, composition and optical transmittance of the film were analyzed using x-ray diffractometer, Scanning probe microscope, x-ray photoelectron spectroscopy and UV-Vis-spectrophotometer, respectively. Dielectric studies such as dielectric constant and loss tangent (tan δ) as a function of frequency for ZnTe film with Al/ZnTe/Al (MSM) configuration reveals dielectric constant of the ZnTe as 7.9. Electrical characterization of the prepared MSM structure was analyzed by measuring current-voltage. The conduction mechanism was deduced as Schottky type from the I–V study.

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Authors and Affiliations

  1. Department of Physics, Yeungnam University, Gyeongsan, 712-749, Korea

    Devaraj Soundararajan, Youngjoo Lim & Ki Hyeon Kim

  2. Daegu-Gyeongbuk Branch of SMB Knowledge Support Center, KISTI, Daegu, 702-712, Korea

    Youngjoo Lim

  3. Korea Institute of Ceramic Engineering and Technology, Seoul, 153-801, Korea

    Myong-Pyo Chun

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  1. Devaraj Soundararajan
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  2. Youngjoo Lim
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  3. Myong-Pyo Chun
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  4. Ki Hyeon Kim
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Correspondence to Ki Hyeon Kim.

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Soundararajan, D., Lim, Y., Chun, MP. et al. Structure and electrical studies on nanostructured ZnTe thin films. Electron. Mater. Lett. 9, 177–182 (2013). https://doi.org/10.1007/s13391-012-2159-y

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  • DOI: https://doi.org/10.1007/s13391-012-2159-y

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