Elsevier

Microelectronics Reliability

Volume 36, Issue 9, September 1996, Pages 1207-1212
Microelectronics Reliability

The power function distribution: A useful and simple distribution to assess electrical component reliability

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Abstract

Statistical distributions have long been employed in the assessment of semiconductor device and product reliability. The use of the exponential distribution which is frequently preferred over mathematically more complex distributions, such as the Weibull and the lognormal among others, suggests that most engineers favour the application of simpler models to obtain failure rates and reliability figures quickly. It is therefore proposed that the power function distribution be considered as a simple alternative which, in some circumstances, may exhibit a better fit for failure data and provide more appropriate information about reliability and hazard rates. The statistical analyses of data obtained from two types of destructive tests demonstrate the applicability of the power function distribution.

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