Definitions and conventions in ellipsometry☆
References (29)
- et al.
J. Opt. Soc. Am.
(1966) Optik
(1965)- et al.
Electromagnetic Waves
Interférences, diffraction et polarisation
J. Opt. Soc. Am.
(1927)
J. Opt. Soc. Am.
(1928)
J. Opt. Soc. Am.
(1965)
Measurement of Optical Constants of Thin Films
J. Opt. Soc. Am.
(1967)
Cited by (0)
- ☆
Work performed under the auspices of the U.S. Atomic Energy Commission.
Copyright © 1969 Published by Elsevier B.V.