Elsevier

Thin Solid Films

Volume 73, Issue 2, 17 November 1980, Pages 353-358
Thin Solid Films

Characterization of surface oxides by Raman spectroscopy

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Abstract

Raman backscattering spectroscopy is used to characterize thin non-metallic films for applications in materials research. In situ studies of the oxidation and hot salt corrosion of iron- and nickel-based alloys demonstrate the capability of obtaining structural and chemical information from surface films on samples at elevated temperatures (up to 850°C). Studies of the oxidation of SAE 310 stainless steel and similar alloys show that phases of iron, chromium and mixed spinel oxides are identifiable in surface films which are too thin for analysis by X-ray diffractometry. This information is obtained both during and after exposure to high temperature environments. Similar data are obtained from alloys undergoing corrosive attack by a surface coating of molten salt. Both salt chemistry and oxide formation are simultaneously monitored using the Raman technique.

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Paper presented at the International Conference on Metallurgical Coatings, San Diego, California, U.S.A., April 21–25, 1980.

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