Elsevier

Thin Solid Films

Volume 234, Issues 1–2, 25 October 1993, Pages 503-507
Thin Solid Films

Spectroscopic variations of optical constant and emissivity of Pt-Al2O3 cermet thin films

https://doi.org/10.1016/0040-6090(93)90318-JGet rights and content

Abstract

Thin films of Pt-Al2O3 cermets were prepared by r.f. cosputtering on glass and metallic substrates. Wide ranges of composition and thickness were investigated. Spectroellipsometric determination of the complex optical constant n = n−ik of semitransparent cermet thin coatings, from UV to IR, are presented. n was measured by spectroscopic phase-modulated ellipsometry in the UV - visible and IR ranges. These results are used for the theoretical analysis of normal emissivity measurements. Examples of normal emission direct measurements are illustrated and compared with calculations. The variations of emissivity with film thickness can then be explained in terms of interference effects.

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