Encapsulation, diffusion and diet in the electron microscope

doi:10.1016/0304-3991(88)90019-8

Ultramicroscopy

Volume 25, Issue 3, 1988, Pages 253-257

https://doi.org/10.1016/0304-3991(88)90019-8 Get rights and content

Abstract

Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.

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K. Takayanagi et al.
Trans. Japan Inst. Metals
(1983)
L.D. Marks
High resolution electron microscopy of surfaces

There are more references available in the full text version of this article.

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Short NoteEncapsulation, diffusion and diet in the electron microscope

Abstract

Surface Sci.

Surface Sci.

Surface Sci.

Trans. Japan Inst. Metals

High resolution electron microscopy of surfaces

Short Note
Encapsulation, diffusion and diet in the electron microscope