Contrast tuning by electron spectroscopic imaging of half-micrometer-thick sections of nervous tissue

doi:10.1016/0304-3991(90)90092-Z

Ultramicroscopy

Volume 32, Issue 1, January 1990, Pages 42-47

https://doi.org/10.1016/0304-3991(90)90092-Z Get rights and content

Abstract

The study of synaptology of single neurones identified by microinjection of electron-dense tracers is greatly simplified by the use of half-micrometer-thick sections and electron spectroscopic imaging (ESI) microscopy. It is demonstrated that the appropriate choice of an energy window of inelastically scattered electrons can be used to overcome contrast problems often encountered in this type of specimen. This method, called “contrast tuning”, serves to optimally visualize areas of both high and low electron density and also to “smooth out” artifacts such as holes and folds.

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Contrast tuning by electron spectroscopic imaging of half-micrometer-thick sections of nervous tissue

Abstract

J. Ultrastruct. Res.

Brain Res.

The Retina

Mikrosk. Elektronenmikrosk.

Exp. Biol.

J. Electron Microsc.

J. Microscopy