Elsevier

Ultramicroscopy

Volume 48, Issue 3, March 1993, Pages 290-296
Ultramicroscopy

Thickness determination of biological thin sections by multiple-least-squares fitting of the carbon K-edge in the electron energy-loss spectrum

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Abstract

We show that the local thickness of biological thin sections can be measured by fitting the electron energy-loss spectrum of the plurally scattered carbon K-edge, and that such measurements are consistent with the results obtained by a conventional method based on the relationship t / λ α In(It / I0). The new method allows the simultaneous measurement and/or mapping of both local thickness and core-level excitations (e.g. Ca L-edge) in this energy range (280–400 eV) without requiring the measurement of the zero-loss and the valence/plasmon excitations.

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Present address: Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA.

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