XPS and EPMA studies on self-healing mechanism of a protective film composed of hydrated cerium(III) oxide and sodium phosphate on zinc
Introduction
Chromate-free, self-healing protective films were prepared on a zinc electrode by previous treatment in an aqueous solution of cerium(III) nitrate Ce(NO3)3 and coverage of sodium phosphate Na3PO4 in the preceding paper [1]. Zinc corrosion at a scratched surface is prevented without further treatment due to the “self-healing” activity of the film. The self-healing ability of the film was examined by polarization measurement and observation of pit formation after the electrode was scratched with a knife-edge crosswise and immersed in an aerated 0.5 M NaCl solution for many hours.
Cerium(III) ion is an effective inhibitor to suppress the cathodic process of zinc corrosion in aerated 0.5 M NaCl by the formation of a hydrated cerium(III) oxide Ce2O3 layer [2]. This layer is highly protective against zinc corrosion in the inhibitor-free NaCl solution but has no self-healing activity at the scratched zinc surface [3]. Phosphate ion suppresses the anodic process by the formation of zinc phosphate Zn3(PO4)2 precipitate at the surface [4].
A film comprising 0.0552 mg/cm2 of Na3PO412H2O was prepared on the zinc electrode previously treated in 1×10−3 M Ce(NO3)3 at 30 °C for 30 min and was dried at 90 °C for 23 h [1]. The thickness of the film including the hydrated Ce2O3 layer was 0.35±0.05 μm. This film was highly protective against zinc corrosion in aerated 0.5 M NaCl at the scratches, the values of the protective efficiency, P (see Eq. (4)) being 95.4% and 95.3% after the immersion for 24 and 72 h, respectively. A pit-like anodic dissolution feature (plf) appeared but a pit arising from growth of the plf was not observed at the scratches after 72 h. It was thus concluded that this film is highly self-healing for preventing zinc corrosion at the scratched surface in 0.5 M NaCl.
In this work, the self-healing activity of this protective film on the scratched zinc electrode is investigated by X-ray photoelectron spectroscopy (XPS) and electron-probe microanalysis (EPMA) for the zinc surface covered with the film after the electrode was scratched crosswise and immersed in the NaCl solution for many hours. Self-healing mechanism of the film on zinc was discussed using polarization curves and results of XPS and EPMA.
Section snippets
Materials
High-grade reagents of Ce(NO3)36H2O and Na3PO412H2O were used for treatments of zinc in this experiment. An aqueous solution of 0.5 M NaCl was prepared by diluting an analytical reagent of NaCl with distilled and deionized water.
A disk of 99.99% Zn (10 mm diameter) was fixed at the end of a glass tube holder with epoxy adhesive and a thermo-shrinkable Teflon tube and adopted as an electrode for polarization measurement. The disk was mounted at the end of Teflon holder with thermo-shrinkable
Polarization measurement
The anodic and cathodic processes of zinc corrosion in aerated 0.5 M NaCl are zinc dissolution and oxygen reduction, respectively,Hence, zinc hydroxide precipitates on the surface, followed by a change to zinc oxide, to form a passive film [5]:Because chloride ion accumulates at defects of the passive film and reacts with the film to form soluble Zn2+–Cl−–OH− complexes [6], the passive film is broken down in places and local
Conclusions
Self-healing mechanism of the thin protective film prepared on the zinc electrode pretreated in 1×10−3 M Ce(NO3)3 at 30 °C for 30 min by covering the electrode with 0.0552 mg/cm2 of Na3PO412H2O and by drying the film at 90 °C for 23 h was investigated by XPS and EPMA after the electrode was scratched with a knife-edge and immersed in aerated 0.5 M NaCl for many hours. X-ray photoelectron spectra showed precipitation of Zn(OH)2, ZnO and a small amount of Zn3(PO4)2 at the scratch and adsorption
References (16)
Corros. Sci.
(2001)Corros. Sci.
(2001)Corros. Sci.
(2001)J. Electron Spectrosc. Relat. Phenom.
(1973)- et al.
Corros. Sci.
(1996) - et al.
Appl. Surf. Sci.
(1993) - et al.
Electrochim. Acta
(1984) - et al.
J. Electron. Spectrosc. Relat. Phenom.
(1980)