Production of solid deuterium targets by ion implantation

doi:10.1016/S0168-9002(97)00375-6

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volume 397, Issue 1, 21 September 1997, Pages 75-80

https://doi.org/10.1016/S0168-9002(97)00375-6 Get rights and content

Abstract

Solid metal, semiconductor and metallic glass samples were irradiated with deuteron atomic ions between 60 and 180 keV incident energies. Accumulation rates of deuterons in different targets were recorded by the detection of protons and neutrons via the ²H(d, p) and ²H(d, n) reactions. A simple analytical expression is given to describe the kinetics of the accumulation.

The dependence of the reaction rate on the deuteron energy gives information on the concentration profile in addition to the neutron flux density spectra. A varying distortion of the implanted deuteron profiles by a change in the beam energy were also observed for different targets.

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Production of solid deuterium targets by ion implantation

Abstract

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Fusion Eng. Des.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth. A

Nucl. Instr. and Meth. A

Nucl. Phys. A

Nucl. Instr. and Meth. B

Scripta Metallurgica Meter.

Nucl. Instr. and Meth.

J. Alloys and Compounds

Nucl. Instr. and Meth. B

Atomki Közlemények

IEEE Trans. Nucl. Sci.