Band gap widening and narrowing in Cu-doped ZnO thin films
Graphical abstract
Introduction
ZnO thin films are considered as one of the most promising optoelectronic materials due to its large band gap (Eg = 3.37 eV) at room temperature and also one of the versatile materials with vast range of applications in solar cells, gas sensors, optoelectronic devices etc, due to their unique optical and electrical properties [1], [2], [3], [4], [5], [6]. The role of doping in ZnO has to be explored further which may be greatly influenced by chemical doping or by inducing intrinsic lattice defects. Copper doping in ZnO modifies the photoluminescence transitions by creating localized impurity levels [7]. The diffusion of Cu into ZnO can lead to formation of various defect centers (CuZn, Cui) since there is a possibility that Cu can replace either substitutional or interstitial Zn atoms in ZnO lattice leading to structural deformations [8], [9], [10], [11]. As Cu is a prominent luminescence activator in II–VI compounds and Cu atoms can further enhance the oxygen adsorption capacity of thin film surfaces. Hence, it is quite significant that ZnO thin films doped with Cu will assist possible modifications in physical and optical properties, since metal dopants play a decisive role for optoelectronic applications. Lattice dynamical properties are affected by partial cationic substitution in ZnO lattice due to change in the effective mass and force constant in the local lattice which results in vibration of optical modes at the center of the Brillouin zone. The presence of local vibrational modes related to the external impurities and the phase segregation can be observed as a result of doping. Raman spectroscopic technique is one of the non-destructive tools that has been exploited here to understand the phonon kinetics of Cu-doped ZnO thin films. This technique is also useful for studying the effects of increase in local strain, substitutional effects, lattice distortion, presence of structural defects and non stoichiometric incorporation either by doping or by any other method. Evolution of Raman modes can be ascribed to the effect of disorder and lattice defects induced either by doping or by annealing which helps in understanding the underlying interaction processes [12], [13], [14]. Impurity induced phonon modes for ZnO thin films doped with N, Fe, Al, Ga, Co and Mn which have been studied by Raman spectroscopy technique [15], [16]. Origin of modes has been attributed to the breakdown of translational symmetry of the lattice which is due to the defects or impurities induced by introducing the dopants into the undoped lattice [17]. Cu incorporation in ZnO thin films leads to intense evolution of longitudinal optical (LO) phonon modes even at low solubility limit for which a few reports are available. The aim of present investigation is to study and analyze the structural and optical modifications in undoped and Cu-doped ZnO thin films fabricated by sol-gel spin coating technique and thus investigating Raman spectra to correlate this analysis to lattice defects and then to predict the optical and structural properties of the system. The modifications in the physical and chemical properties of ZnO thin films are hence studied by introducing metal cationic dopant into the lattice structure at different concentrations in order to understand the observed modifications.
Section snippets
Experimental
Cu doped ZnO thin films were deposited on silicon and quartz substrate of about 300 nm thickness by sol-gel spin coating technique which is a chemical route and also cost effective procedure [18]. For designing CuZnO thin film at different concentrations, CuZnO solution was prepared by mixing Copper chloride (CuCl) and Zinc acetate dihydrate Zn(CH3COO)2·2H2O with 2-methoxyethanol at room temperature, followed by the addition of mono ethanolamine (MEA) which is a highly water soluble, non-ionic
Structural studies
Fig. 1 shows the characteristic X-ray diffraction (XRD) pattern of 700 °C annealed Cu-doped ZnO thin films. The polycrystalline nature with hexagonal wurtzite structure of ZnO has been confirmed from the obtained pattern. The diffraction peaks are oriented in (100), (002) and (101) planes in accordance with JCPDS# 36-1451. The peak positions of (002) orientations for all five samples are shown. The shift in the peak position with respect to undoped samples relates with uniform diffusion and
Conclusion
Cu-doped ZnO thin films have been synthesized by sol-gel spin coating technique. GAXRD results show the polycrystalline thin films with increased crystallite size and decreased stress and strain values along with phase segregation on varying doping concentration. Raman structural analysis also confirms the stress effect on suppressed E2 (high) mode and CuO phase formation upon doping ZnO thin films with Copper. The increase in crystallite size is thereby confirmed by XRD, SEM and AFM analysis.
Acknowledgements
Authors are grateful to the Director (IUAC), New Delhi, for providing support throughout work. Authors are also thankful to Dr. S.A. Khan and Dr. (Mrs.) I. Sulania for experimental support in SEM and AFM investigations, respectively; while Mr. A. Das for the critical reading of the manuscript. One of the authors (KJ) is also thankful to UGC for providing the financial support under the scheme of Ph.D. fellowship.
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