Effect of NaOH solution on surface textured ZnO: Al films prepared by pulsed direct current magnetron sputtering

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Abstract

Transparent conducting Al-doped ZnO (ZnO:Al, AZO) thin films were prepared at substrate temperature of 270 °C by pulsed direct current magnetron sputtering. NaOH solution (5 wt%) was employed to etch the AZO films at room temperature, and the surface textured AZO films were obtained successfully. The relationship between the surface textured structures and the etching process controlled by etching time was discussed. The textured morphology of the etched AZO films became clear as increasing the etching time, and the AZO film etched for 30 min exhibited uniformly and distinctly crater-like surface textured structure. Correspondingly, the haze and the resistivity increased with the increasing etching time. And the resistivity of the AZO film etched for 30 min was 3.2×10−3 Ω cm.

Introduction

ZnO, a wide band gap semiconductor, is a promising optoelectronic material [1], [2], [3], [4], [5], [6], [7], [8]. In particular, ZnO:Al (AZO) thin film has attracted much attention as the front electrode in silicon-based thin film solar cells in recent years due to its low cost, low resistivity, high transparency in the visible wavelength range, non-toxicity and stability under hydrogen plasma environment [9], [10], [11]. Moreover, in order to achieve a high efficiency in thin film solar cells, the smooth surface of AZO film deposited by sputtering is generally transformed to the textured surface by wet chemical etching, which can elongate the effective light path by means of light trapping. In most researches, diluted HCl with a concentration of 0.5% was used as the typical etching solution for the formation of surface textured AZO films [12], [13], [14], [15]. However, it is difficult to control the etching process and the surface morphology because of the high etching rate of HCl solution. To slow down the etching rate, NH4Cl solution and weak acetic acid solution were used to achieve surface textured AZO films [16], [17], but the surface morphology was not quite satisfactory yet. Surface textured structures of AZO films can also be obtained with NaOH solution which can control the etching process and the surface morphology effectively. But up to now, few studies on the surface textured AZO films etched with NaOH solution have been reported [18].

In this paper, we report the preparation of surface textured AZO thin films by etching with NaOH solution. Through the wet-chemical etching process, effective surface textured structures were obtained in NaOH solution (5 wt%) successfully. The optoelectronic properties and the etching behaviors as a function of etching time were studied.

Section snippets

Experimental

AZO films were prepared at substrate temperature of 270 °C on glass substrates by pulsed direct current magnetron sputtering. The target was ZnO:Al2O3 (2 wt%) ceramics and the sputtering gas was Ar (99.999% in purity). After cleaning procedures, the substrate was loaded into the sputtering chamber. The base pressure was 3×10−3 Pa. Deposition was carried out after pre-sputtering for 5 min in order to clean the target surface. During the process of deposition, the working pressure and the sputtering

Results and discussion

Fig. 1 shows the XRD pattern (linear scale) of the as-deposited AZO film by sputtering. A strong diffraction peak at 2θ near 34° and a weak peak near 72° appear, associated with (002) and (004) plane, respectively. And (100), (101) and (102) slight peaks are observed when the y-axis is changed to a logarithmic scale (inset of Fig. 1). It indicates that the AZO film has a typical hexagonal wurtzite structure with c-axis preferred orientation [19]. The result reveals that the dopant Al does not

Conclusions

In summary, effective surface textured structures of the ZnO:Al films deposited by pulsed direct current magnetron sputtering were obtained successfully with the NaOH solution (5 wt%) at room temperature. When the AZO film was etched for 30 min, typical discernable crater-like textured structures were observed, and the diameters of the regular distributed craters were in the range of 0.5–1 μm. The haze of the textured AZO films increased gradually as increasing the etching time. The AZO film

Acknowledgments

This work was supported by the National Natural Science Foundations of China (Grant no. 51002018 and 51102030), the Project of Open Research Foundation of the Ministry of Education Key Laboratory of Materials Modification (Dalian University of Technology) (Grant no. DP1050901), the Dalian Economy and Communication Committee Foundation of China (Grant no. 2009–3–215-jw-cxyhz) and the Dalian Science and Technology Plan Projects of China (Grant no. 2010J21DW008 and 2011A15GX025).

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