Durability under mechanical bending of the indium tin oxide films deposited on polymer substrate by thermionically enhanced sputtering
Introduction
Indium tin oxide (ITO) films have been extensively applied in flat panel displays [1], [2] and photovoltaic devices [3], [4] as transparent conductive oxide (TCO) electrodes because of their low electrical resistivity and high optical transmittance. The emerging demand for flexible display panels has created a demand for coating techniques capable of depositing high-quality TCOs on polymeric materials to particularly achieve light-weight, compactness, impact tolerance [5], [6] and mechanical bending durability [7], [8]. Among commonly used polymeric materials, PET (polyethylene terephthalate) and PC (polycarbonate) have been considered as substrate materials for flexible displays because of their satisfactory optical transmittance and low material cost compared to other materials [9].
Modified sputter deposition techniques have directly obtained promising results to deposit ITO films on flexible substrates at a low deposition temperature. Yang [10] found a resistivity of 6.3 × 10−4 Ω cm and an average optical transmittance of 80% by utilizing an RF magnetron sputtering system with supplemental substrate biasing to deposit ITO film on PPA (polypropylene adipate) substrates. Kim [11] added negative cesium ions into a glow discharge sputtering system to impart additional energy into the growing ITO film, to achieve an electrical resistivity of 6.2 × 10−4 Ω cm and an average optical transmittance of 87%. Hoshi and Kiyomura [12] accomplished an electrical resistivity of 3.5 × 10−4 Ω cm and an average optical transmittance over 80% by using an RF applied grid in the DC sputtering system to increase ion density. Our previous study also demonstrated a thermionic electron emission (TE) approach as a supplement to the DC sputtering system to obtain an ITO film with an electrical resistivity of 4.5 × 10−4 Ω cm and an average optical transmittance of 80% [13]. The TE approach can be utilized to deposit high-quality ITO deposition at relatively low substrate temperature with low-cost equipment. The quality of the film thus formed, in terms of electrical resistivity and optical transmittance, is improved by the increased crystallinity of the film under intense ion bombardment. However, thermal expansion and elastic properties for both TCO films and polymer substrates are very different, resulting in large mechanical stresses. A TCO film on a PET polymer substrate subjected to such stress cracks and eventually fractures, markedly reduces its electrical conductivity. Cairns et al. [14] investigated the mechanical properties of ITO films on a PET substrate, focusing on the cracking mechanism and its relationship to electrical properties. In addition, Fortunato et al. [15] also observed that ZnO:Al cracking under increasing strain increases its resistance. This result is consistent with similar studies of silicon oxide deposited on the PET substrate [16].
Most studies on the above subject have been performed using thin films on polymer substrates and have demonstrated initial cracking and the mechanism failure of electrical conductivity of thin films. The current authors’ earlier study sought to obtain high-quality ITO films deposited by TE, and motivates this study. The goal of this study is to improve electrical response the ITO-coated PET under static and dynamic mechanical bending to improved crystallinity and the film adhesion through the TE technique which contributes to resist damage under mechanical action. This paper investigates the effect of mechanical bending of an ITO film deposited by DC magnetron sputtering on a PET substrate with and without TE. A discussion follows about the change in electrical resistance of ITO-coated PET specimens under a single static bending event and their durability under dynamic repeated bending.
Section snippets
Materials and methods
The schematic of the DC magnetron sputter system incorporating thermionic emission apparatus is shown in Fig. 1(a) and the filament assembly is shown in Fig. 1(b). The current study used a 0.6 mm diameter tungsten filament for electron emission. The filament was negatively biased to a voltage of −30 V relative to the coating chamber by a DC current power supply and resistively heated to generate electron emission current at 3 A. The ITO target used for sputtering was In2O3:SnO2 = 90:10 (wt.%). The
Microstructure of the deposited ITO films
Fig. 3 shows the X-ray diffraction patterns and the corresponding cross sectional film morphologies of ITO-deposited specimens. The XRD pattern of ITO film deposited without TE shows an amorphous feature. In the case of the film deposited with TE, diffraction peaks of ITO (2 2 2), (4 0 0), (4 4 0) and (6 2 2) clearly demonstrate a crystalline structure in the deposited ITO film. The presence of the crystalline structure is likely due to the accompanying substrate temperature elevation and intensified
Conclusions
The current study involves the microstructure investigation of an ITO thin film, deposited on a flexible PET substrate by DC magnetron sputtering with thermionic emission enhancement. The microstructure explains enhanced durability of electrical and optical properties of the film under static and dynamic mechanical bending. The film deposited with TE has a higher average visible transmittance of 83%, compared to the ITO film deposited without the thermionic emission enhancement and a lower
Acknowledgements
The authors appreciate Dr. Chin-Chiuan Guo in Chienkuo Technology University in Taiwan for generously offering four-point probe tester and Hall Effect measurement rig. This work was financial supported by the National Science Council of Taiwan under the grant NSC94-2216-E-035-004.
References (30)
- et al.
Stable organic thin-film transistor in a pixel for plastic electronics
Org. Electron.
(2008) - et al.
Transparent and conducting ITO films: new developments and applications
Thin Solid Films
(2002) - et al.
New low band-gap alternating polyfluorene derivatives for photovoltaic cells
Thin Solid Films
(2006) - et al.
Indium tin oxide-free semi-transparent inverted polymer solar cells using conducting polymer as both bottom and top electrodes
Org. Electron.
(2009) - et al.
Comparison study of ITO thin films deposited by sputtering at room temperature onto polymer and glass substrates
Thin Solid Films
(2005) - et al.
Properties of ITO on PET film in dependence on the coating conditions and thermal processing
Surf. Coat. Technol.
(2005) - et al.
Mechanical modeling of flexible OLED devices
Org. Electron.
(2009) - et al.
Polymers for flexible displays: from material selection to device applications
Prog. Polym. Sci.
(2008) - et al.
Low-temperature deposition of ZnO thin films on PET and glass substrates by DC-sputtering technique
Thin Solid Films
(2006) - et al.
Bias voltage dependence of properties for depositing transparent conducting ITO films on flexible substrate
Thin Solid Films
(2000)
Influence of negative metal ion bombardment on the properties of ITO PET films deposited by dc magnetron sputtering
J. Non-Cryst. Solids
ITO thin films deposited at low temperatures using a kinetic energy controlled sputter-deposition technique
Thin Solid Films
Indium tin oxide films deposited by thermionic-enhanced DC magnetron sputtering on unheated polyethylene terephthalate polymer substrate
Mater. Res. Bull.
Effects of heat treatment on properties of ITO films prepared by rf magnetron sputtering
Vacuum
Crystallization and decrease in resistivity on heat treatment of amorphous indium tin oxide thin films prepared by dc Magnetron sputtering
Thin Solid Films
Cited by (53)
Enhanced electrochromic and mechanical properties of WO<inf>3</inf> film by substrate effect
2023, Surfaces and InterfacesEffects of cyclic deformation on conductive characteristics of indium tin oxide thin film on polyethylene terephthalate substrate
2015, Surface and Coatings TechnologyCitation Excerpt :It is found that electrical resistance of ITO thin film changes dramatically at a high strain due to an increasing number of cracks on coating surface or interfacial and buckling delamination of bonded layers [22]. Cyclic bending tests are widely introduced to address the damage accumulation of brittle thin film on polymeric substrate [23–34]. Some cyclic bending tests are also incorporated with an in-situ electrical resistance measurement technique during deformation of samples [24–29,32].