Effect of sintering conditions on the dielectric properties of CaCu3Ti4O12 and La2/3Cu3Ti4O12 ceramics: A comparative study

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Abstract

The microstructural and dielectric properties of La2/3Cu3Ti4O12 (LCTO) ceramics were found to be less sensitive to the sintering conditions. In contrast, these had imprinting effects on the dielectric characteristics of CaCu3Ti4O12 (CCTO) ceramics. The dielectric constant of CCTO increased drastically with increase in sintering temperature and duration as a consequence of significant change in the microstructural and compositional heterogeneity, while the increase was nominal in the case of LCTO ceramics. The dielectric behavior of both the ceramics was explained based on the Maxwell–Wagner relaxation arising mostly from the interfaces between grains and the grain boundaries.

Introduction

Electroceramics associated with giant dielectric constants accompanied by low loss have been on increasing demand owing to their potential use in miniaturized devices [1], [2], [3], [4], [5]. Hence, recently synthesized giant dielectric constant material CaCu3Ti4O12 (CCTO) has attracted much attention because of its potential technological applications. It shows extremely high dielectric constant (>104) at room temperature [2], [6], [7]. Impedance spectroscopic data obtained on CCTO ceramics demonstrated their electrical heterogeneous character (the existence of electrically semiconductive grains and highly resistive grain boundaries), and large dielectric constant was attributed to grain boundary barrier layer capacitance effects [8], [9], [10]. Apart from this, the dielectric constant of CCTO was reported to be highly dependent on the processing conditions such as milling time, sintering temperature, duration of sintering, etc. [9], [10], [11], [12]. The dielectric constant ranging from 2000 to 80,000 was achieved by varying the sintering temperature and ascribed to giant barrier layer effects at the grain boundary [9].

It is intriguing to note that CCTO is the only member of the ACu3M4O12 (A=alkali, alkaline-earth metal, rare-earth metal or vacancy, M=transition metal) family of oxides exhibiting an unusually high dielectric constant (εr′>104). All other members of the above series were reported to have dielectric constant less than 3000 [2], [13]. Hence, one is curious to know whether these are also of microstructural dependent. We thought it was worth investigating into the effect of processing conditions on the microstructural and dielectric characteristics of low dielectric constant materials of the series and compare with that of CCTO ceramics. It was noticed that the microstructural features such as grain size and grain boundary layer thickness of CCTO ceramics had strong dependence on the sintering duration at elevated temperatures.

In this paper, we report the details concerning the influence of sintering conditions on the microstructural and dielectric characteristics of La2/3Cu3Ti4O12 (LCTO) and CCTO ceramics belonging to the low and high dielectric constant members of ACu3M4O12 family of oxides, respectively. We believe that the present studies would help in providing more insight and rationalizing the dielectric behavior of these ceramics.

Section snippets

Experimental

Polycrystalline ceramic powders of LCTO were prepared via the conventional solid-state reaction route using stoichiometric amounts of La2O3, CuO and TiO2. These were thoroughly mixed in an acetone medium using a ball mill. Subsequently these mixtures were oven dried for about 2 h. This was followed by the calcination of the powder in alumina crucible at 1000–1025 °C with intermittent grinding for 10 h. The formation of the monophasic compound was confirmed via X-ray powder diffraction (XRD) using

Structural and microstructural analyses

The XRD powder pattern obtained for LCTO is shown in Fig. 1. The pattern could be indexed to a cubic cell (space group Im3) associated with the lattice parameter a=0.739nm, which is in good agreement with the one reported for LCTO in the literature [13]. Fig. 2(a–c) shows the scanning electron micrographs recorded for LCTO pellets sintered for 10, 20 and 40 h, respectively. It is evident from these micrographs that the grains have smooth faces associated with cubic appearance. There is only a

Conclusions

La2/3Cu3Ti4O12 (LCTO) and CaCu3Ti4O12 (CCTO) ceramics were prepared by solid-state reaction route and were sintered for different durations. Systematic studies on the microstructural features and dielectric properties were performed on these samples. Microstructure of the CCTO was found to be strongly dependent on the sintering temperature and duration unlike LCTO. A 10-fold increase in the grain size was observed in CCTO on increasing the sintering duration from 2.5 to 10 h at 1100 °C. The

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