Investigation of Ag-bulk/glassy-phase/Si heterostructures of printed Ag contacts on crystalline Si solar cells

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Abstract

The interface structure of screen-printed silver contacts on a crystalline silicon solar cell has been studied by transmission electron microscopy (TEM). TEM results confirmed that the glassy-phase plays an important role in contact properties. There are at least three different microstructures present in optimal fired contacts. The location where silver-bulk directly contacts silicon is observed through SEM, and this is actually a very thin glass layer in between. In addition, high-density silver embryos on silicon were found for samples fired optimally. The results presented in this study suggest that Ag-bulk/thin-glass-layer/Si contact is the most decisive path for current transportation.

Introduction

The screen-printed Ag thick-film is the most widely used front-side contact in industrial crystalline silicon solar cells. The front contacts have the roles of efficiently making contacting with the Si and transporting the photogenerated current without adversely affecting the cell properties and without damaging the p–n junction. Although it is rapid, has low cost and is simplicity, high-quality screen-printed Ag contact is not easy to make due to the complicated composition in the Ag paste. Commercially available Ag pastes generally consist of Ag powders, lead-glass frit powders and an organic vehicle system. The organic constituents of the Ag paste are burned out at temperatures below 500 °C. Ag particles, which are ∼60–80 wt% and can be different in shape and size distribution, show good conductivity and minor corrosive characteristics. The concentration of glass frit is usually less than 5 wt%; however, the glass frit in the Ag paste plays a critical role for achieving good-quality contacts to high-doping emitters [1], [2], [3], [4]. The optimization of the glass frit constitution can help achieve adequate photovoltaic properties.

The melting characteristics of the glass frit and also of the dissolved Ag have significant influence on contact resistance and fill factors (FFs) [5]. Glass frit advances sintering of the Ag particles, wets and merges the antireflection coating. Moreover, glass frit forms a glass layer between Si and Ag-bulk, and can further react with Si-bulk and forms pin-holes on the Si surface upon high-temperature firing. The contact microstructures should have a high impact on current transport across the contact interface. Therefore, more work is needed to understand the structure and electrical behaviors of the Ag-bulk/Si contact structures.

The objective of this work was to improve the understanding of front-side contact formation by analyzing the individual contact types and their role in the Ag-bulk/Si contact. Transmission electron microscopy (TEM) was used to study the microstructures and features at the contact interface. TEM of contact cross-section revealed high-density Ag-embryos on Si-bulk in samples fired optimally. The density of Ag-embryo, counted via TEM, is more than 2×1016 cm−2 in some locations. This study also confirms that the spacing between Ag-embryos and Ag-bulk can be less than 5 nm. It is suggested that Ag-bulk/thin-glass-layer/Si contact is the most decisive path for current transportation. Possible conductance mechanisms of electrons across the contact interface are also discussed.

Section snippets

Experiment

This study is based on industrial single-crystalline silicon solar cells with an SiNx antireflection coating, screen-printed Ag thick-film front contacts and a screen-printed Al-BSF. The contact pattern was screen printed using a commercial PV145 Ag paste from DuPont on top of the SiNx antireflective coating (ARC) and fired rapidly in a belt furnace. The exact Ag paste compositions are not disclosed by the paste manufacturers. The glass frit contents are estimated from the results found in this

Results and discussion

The microstructural properties of the screen-printed Ag-bulk/Si contacts were examined by TEM at 200 kV. TEM results confirmed that the glassy-phase plays an important role in contact properties. The typical Ag-bulk/Si microstructure, which includes localized large glassy-phase region, is shown in Fig. 1(a). The area where Ag-bulk directly contact with Si through SEM observation is actually with a very thin glass layer (<5 nm) in between as shown in Fig. 1(b). This possibly can be attributed to

Conclusion

The structural properties of the screen-printed Ag-bulk/Si contacts were investigated in this study. It was found that in optimally fired contacts there are at least three different microstructures. TEM results confirmed that the glassy-phase plays an important role in contact properties. The location where Ag-bulk directly contacts Si, through SEM observation, is actually a very thin glass layer (<5 nm) in between. In addition, high-density Ag-embryos on Si-bulk were found for samples fired

Acknowledgments

The authors would like to thank the support of Bureau of Energy (MOEA) under the Project no. 95-D0132. We are grateful to Cher-Zer Yang, Chia-Pin Chuang, Wen-Chuan Hou and Chin-Rong Chang for preparing solar cell samples used for this work. We also thank Chih-Jen Lin for his TEM operation.

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