Effects of substrate temperature on the efficiency of hydrogen incorporation on the properties of Al-doped ZnO films

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Abstract

Al-doped ZnO (AZO) transparent conducting films were successfully prepared on glass substrates by RF magnetron sputtering at different substrate temperatures in Ar and H2 + Ar sputtering ambient. The effects of substrate temperature on the effectiveness of hydrogen incorporation in Al-doped ZnO films were investigated. The microstructural, electrical and optical properties of AZO films were systematically analyzed by surface profiler, X-ray diffractometry, scanning electron microscope, four-point probe measurement and UV/vis spectrophotometer. The XRD patterns and SEM pictures indicate that the crystallinity of AZO thin films was markedly improved with hydrogen incorporation at low substrate temperature, while the improvement of crystallinity was not an obvious change at high substrate temperature. The results also indicate that hydrogen incorporation has the stronger effectiveness on the transparent conductive properties of AZO films with the substrate temperature decreasing. The resistivity of the films decreases, especially for lower substrate temperatures, due to the incorporation of hydrogen atoms. These results suggest that substrate temperature should be controlled to the lower level to effectively reduce resistivity without detriment to transmittance of AZO thin films when hydrogen is incorporated.

Highlights

► Hydrogen is more effective in improving crystallinity at low substrate temperature. ► Hydrogen is more effective in improving electrical properties at low Tsubstrate. ► Hydrogen is more effective in improving the optical transmittance at low Tsubstrate. ► The lowest resistivity of 7.5 × 10−4 Ω cm was obtained with hydrogen incorporation.

Introduction

Transparent conductive oxide (TCO) films have been extensively used in a variety of electronic and opto-electronic applications such as displays, solar cells, optoelectronic devices, electrochromic devices, etc. [1]. Al-doped ZnO (AZO) thin films are intensively studied to replace ITO thin films, which are most generally used in transparent conducting films, due to its non-toxic, low cost, with high thermal/chemical stability and resource availability [2], [3], [4], [5], [6]. Compared with various deposition techniques including sputtering, pulse laser deposition, chemical vapor deposition and sol–gel process [7], [8], [9], [10], the RF magnetron sputtering method has the advantages in simplifying fabrication step, lowing production cost and lowing temperature process as well as improving reproducibility. Unfortunately, these deposition techniques required relatively high temperatures [11], [12] to obtain good electrical and optical properties. Therefore, it has limited the transparent electrode application of AZO on plastic substrates or sensitive photoresist as those used in light emitting diodes and solar cells.

Recently, there is a particular interest in the properties of hydrogen in ZnO, because density function theory and total energy calculations predict that H always acts as a donor in ZnO and some other oxides [13], [14], [15], [16]. Unlike in many other materials, H partially compensates the conductivity provided by extrinsic dopants in some other oxides [17]. Nevertheless, there are few reports on the influence of hydrogen on the electrical and optical properties of AZO grown at different substrate temperatures by magnetron sputtering. The role of hydrogen in the growth process of magnetron sputtered AZO films is not completely understood yet. Especially, the effects of substrate temperature on the effectiveness of hydrogen incorporation in Al-doped ZnO films were not reported yet.

In this study, AZO thin films were prepared on glass substrates by RF magnetron sputtering at different substrate temperatures in Ar and H2 + Ar sputtering ambient. We demonstrate that the effectiveness of hydrogen doping in AZO thin films is dependent on the substrate temperature and ranged from 100 to 250 °C. Effects of the hydrogen incorporation on the electrical, optical, and structural properties of AZO thin films were investigated in depth.

Section snippets

Experimental

The AZO films were dynamically deposited on glass substrates by using RF magnetron sputtering at different substrate temperatures ranging from 100 to 250 °C in Ar and H2 + Ar sputtering ambient. Before deposition, the glass substrates with the area of 300 × 300 mm2 were ultra-sonically cleaned in acetone, methyl alcohol and deionized water, respectively and subsequently were dried in flowing nitrogen gas. A large-size rectangular sintered ceramic target (75 × 450 mm) with an Al2O3 content of 2.0 wt.% was

X-ray diffraction analysis

In order to investigate the effects of substrate temperature and hydrogen incorporation on the structural properties of AZO films, XRD measurements were performed to compare AZO films in Ar and H2 + Ar sputtering ambient at substrate temperatures of 100, 150, 200, 225 and 250 °C. As shown in Fig. 1, all the AZO films grown on the glass substrate exhibit a strong peak near 2θ = 34.4° and a weak peak at 72.5°. These peaks are associated with (0 0 2) and (0 0 4) planes of the hexagonal phase, suggesting

Conclusion

Transparent conductive AZO films have been prepared successfully on the glass substrates by RF magnetron sputtering at various substrate temperatures. The effects of substrate temperature on the effectiveness of hydrogen incorporation in Al-doped ZnO films were investigated. The XRD patterns show that crystallinity of AZO thin films was markedly improved with hydrogen incorporation at low substrate temperature, while improvement of crystallinity was not obvious at high substrate temperature.

Acknowledgments

This project was supported by the National Natural Science Foundation of China (Grant No. 50902028) and International Science & Technology Cooperation Program of Sino-Russian (Grant Nos. 2009DFR50160 and 2009DFR50350). This work was also financially supported by Shenzhen Public Science & Technology Research Plan (No. SY200806260033A), Cooperation Research Plan between Shenzhen & Hongkong (No. SG200810100007A), and Shenzhen Fundamental Research Plan (Nos. JC201104220174A and JC201105191001A).

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