Elsevier

Synthetic Metals

Volume 161, Issues 1–2, January 2011, Pages 32-39
Synthetic Metals

Rectification and barrier height inhomogeneous in Rhodamine B based organic Schottky diode

https://doi.org/10.1016/j.synthmet.2010.10.030Get rights and content

Abstract

Thermogravimetric analysis (TGA) and X-ray diffraction (XRD) were used to study the structure characterization of the Rhodamine B (Rh.B). The thermal stability and the lattice parameters were calculated using TGA and XRD, respectively. Bulk Al/Rh.B Schottky barrier device was prepared and their properties have been investigated by current density–voltage JV and capacitance–voltage CV characteristics in the temperature range 300–400 K. The device parameters extracted from the JV and CV characteristics are strongly influenced by the effect of temperature. The device exhibits a strong rectification characteristic and shows a maximum rectification ratio at ≈0.15 V for all the studied temperature range. The results clearly demonstrate that the electron transport at the Al/Rh.B interface is significantly affected by low barrier patches. The discrepancy between Schottky barrier heights (SBHs) obtained from the temperature dependencies of both JV and CV measurements is explained by the introduction of a spatial distribution of BHs due to the barrier height inhomogeneities that prevail at the Al/Rh.B interface. The deviations of apparent BHs were investigated by considering the microstructure of the Al/Rh.B interface. Moreover, the distribution of carrier concentration through the width of the depletion region is nearly uniform.

Introduction

Rhodamine dyes family was among the oldest and most commonly used of all synthetic dyes and used in the field of different areas. Initially, they were used for cloth coloration [1], [2], [3]. Owing to their unique optical properties, they served as water tracing agents, fluorescent markers for microscopic structure studies, photosensitizers, and as laser dyes. The rhodamine B itself is a commercially available dye with high purity and stability [2], [3], [4], [5], [6], [7].

In recent years, there are many research works focusing on the fabrication of electrical devices based on rhodamine family. Karataş et al. [7] have reported that the non-polymeric organic compound known as Rhodamine 110 (Rh.101) interfaced to the inorganic p-Si provides the rectifying IV characteristics. They have obtained a value of 0.817 eV for the Al/Rh.101/p-Si/Al contact at the room temperature that is significantly larger than the value of 0.58 eV of the conventional Al/p-Si Schottky diode. Furthermore, they have fitted the results to a model of a Gaussian distribution of the barrier heights to explain the fluctuations of the characteristic parameters suggesting that the contacts are not spatially uniform. Ahmed and yassin [8] have fabricated poly[2-methyl-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene] (MEH-PPV) conducting polymers Schottky diodes and investigated the effect of doping MEH-PPV conjugate polymer by Nile blue (NB) and Rhodamine B (Rh.B) as electron acceptor fluorescent dyes on their current–voltage characteristics. They have found that the dielectric permittivity of the active layer of the organic layer is an important factor in determining the efficiency of the MEH-PPV Schottky diode. Vural et al. [9] have showed that the rectifying contacts of electronic devices can be fabricated using an organic compound layer such as Rh.101 between metal and inorganic semiconductor such as GaAs. They have reported that the diode parameters values are remarkably different from those given for metal/GaAs semiconductor contacts in literature. Karataş and Çakar [10] have studied the electrical properties of Sn/Rh.101/p-Si/Al Schottky structures. They found that the interface state densities have an exponential rise with bias from 0.16 EV to 0.92 EV, for the mid-gap towards the top of the valence band of the p-Si. They concluded that Rh.101 organic layer controls electrical charge transport properties of Sn/p-Si Schottky structure, and it has been shown that the rectifying contacts or electronic devices can be fabricated using an organic compound layer between metal and inorganic semiconductor. Recently, the conduction mechanism of Rhodamine B was studied under the effect of dc and ac fields by Yahia and co-workers [11]. They concluded that Rhodamine B has a semiconducting characteristics and the ac conduction mechanism is controlled by correlated barrier hopping, CBH model.

According to the aforementioned survey, the purpose of the present study is to examine whether or not the Al/Rh.B contact, without using any single crystalline substrate, can be used as a rectifying contact and obtained a higher barrier height than that of using conventional inorganic Schottky contact at room temperature. Furthermore, the temperature dependence of the experimental forward bias current density–voltage (JV) and capacitance–voltage (CV) characteristics for the prepared device were investigated over the temperature range of 300–400 K.

Section snippets

Materials

Rhodamine B, [9-(2-carboxyphenyl)-6-diethylamino-3-xanthenylidene] diethylammonium chloride, was obtained from Aldrich with high purity. Pure aluminum and gold were used as rectifying and ohmic contacts with Rh.B, respectively.

Processes and fabrication of the Al/Rh.B device

Discs of 1 mm thickness and 6.5 mm radius of the Rh.B dye were formed via the application of 5 tons. The ohmic (Au) and non-ohmic (Al) electrodes were evaporated on the Rh.B discs using a high vacuum coating unit (Edwards, E-306 A), kept at room temperature during the

Thermogravimetry analysis and X-ray diffraction of Rh.B

Thermogravimetry analysis (TGA) is a process in which a substance is undergoes to decompose in the presence of heat, which causes bonds within the molecules to be broken. TGA plays an important role in determining the thermal stability of different materials especially for organic substances. TGA thermogram of Rh.B is shown in Fig. 2. As observed, Rh.B is stable in the temperature up to 210 °C. After which the weight loss is occurred in an individual step whereas the loss occurred during the

Conclusion

TGA analysis illustrates that Rh.B has a high stability up to 210 °C. The analysis of XRD for Rh.B in powder form revealed the polycrystalline nature of tetragonal structure with space group P4. Temperature dependence of JV and the reverse bias CV characteristics of Al/Rh.B structure were investigated. It was seen that a high rectification characteristics are observed. Moreover, there is a discrepancy between barrier heights obtained from JV and CV measurements. This discrepancy is

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