Rectification and barrier height inhomogeneous in Rhodamine B based organic Schottky diode
Introduction
Rhodamine dyes family was among the oldest and most commonly used of all synthetic dyes and used in the field of different areas. Initially, they were used for cloth coloration [1], [2], [3]. Owing to their unique optical properties, they served as water tracing agents, fluorescent markers for microscopic structure studies, photosensitizers, and as laser dyes. The rhodamine B itself is a commercially available dye with high purity and stability [2], [3], [4], [5], [6], [7].
In recent years, there are many research works focusing on the fabrication of electrical devices based on rhodamine family. Karataş et al. [7] have reported that the non-polymeric organic compound known as Rhodamine 110 (Rh.101) interfaced to the inorganic p-Si provides the rectifying I–V characteristics. They have obtained a value of 0.817 eV for the Al/Rh.101/p-Si/Al contact at the room temperature that is significantly larger than the value of 0.58 eV of the conventional Al/p-Si Schottky diode. Furthermore, they have fitted the results to a model of a Gaussian distribution of the barrier heights to explain the fluctuations of the characteristic parameters suggesting that the contacts are not spatially uniform. Ahmed and yassin [8] have fabricated poly[2-methyl-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene] (MEH-PPV) conducting polymers Schottky diodes and investigated the effect of doping MEH-PPV conjugate polymer by Nile blue (NB) and Rhodamine B (Rh.B) as electron acceptor fluorescent dyes on their current–voltage characteristics. They have found that the dielectric permittivity of the active layer of the organic layer is an important factor in determining the efficiency of the MEH-PPV Schottky diode. Vural et al. [9] have showed that the rectifying contacts of electronic devices can be fabricated using an organic compound layer such as Rh.101 between metal and inorganic semiconductor such as GaAs. They have reported that the diode parameters values are remarkably different from those given for metal/GaAs semiconductor contacts in literature. Karataş and Çakar [10] have studied the electrical properties of Sn/Rh.101/p-Si/Al Schottky structures. They found that the interface state densities have an exponential rise with bias from 0.16 EV to 0.92 EV, for the mid-gap towards the top of the valence band of the p-Si. They concluded that Rh.101 organic layer controls electrical charge transport properties of Sn/p-Si Schottky structure, and it has been shown that the rectifying contacts or electronic devices can be fabricated using an organic compound layer between metal and inorganic semiconductor. Recently, the conduction mechanism of Rhodamine B was studied under the effect of dc and ac fields by Yahia and co-workers [11]. They concluded that Rhodamine B has a semiconducting characteristics and the ac conduction mechanism is controlled by correlated barrier hopping, CBH model.
According to the aforementioned survey, the purpose of the present study is to examine whether or not the Al/Rh.B contact, without using any single crystalline substrate, can be used as a rectifying contact and obtained a higher barrier height than that of using conventional inorganic Schottky contact at room temperature. Furthermore, the temperature dependence of the experimental forward bias current density–voltage (J–V) and capacitance–voltage (C–V) characteristics for the prepared device were investigated over the temperature range of 300–400 K.
Section snippets
Materials
Rhodamine B, [9-(2-carboxyphenyl)-6-diethylamino-3-xanthenylidene] diethylammonium chloride, was obtained from Aldrich with high purity. Pure aluminum and gold were used as rectifying and ohmic contacts with Rh.B, respectively.
Processes and fabrication of the Al/Rh.B device
Discs of 1 mm thickness and 6.5 mm radius of the Rh.B dye were formed via the application of 5 tons. The ohmic (Au) and non-ohmic (Al) electrodes were evaporated on the Rh.B discs using a high vacuum coating unit (Edwards, E-306 A), kept at room temperature during the
Thermogravimetry analysis and X-ray diffraction of Rh.B
Thermogravimetry analysis (TGA) is a process in which a substance is undergoes to decompose in the presence of heat, which causes bonds within the molecules to be broken. TGA plays an important role in determining the thermal stability of different materials especially for organic substances. TGA thermogram of Rh.B is shown in Fig. 2. As observed, Rh.B is stable in the temperature up to 210 °C. After which the weight loss is occurred in an individual step whereas the loss occurred during the
Conclusion
TGA analysis illustrates that Rh.B has a high stability up to 210 °C. The analysis of XRD for Rh.B in powder form revealed the polycrystalline nature of tetragonal structure with space group P4. Temperature dependence of J–V and the reverse bias C–V characteristics of Al/Rh.B structure were investigated. It was seen that a high rectification characteristics are observed. Moreover, there is a discrepancy between barrier heights obtained from J–V and C–V measurements. This discrepancy is
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