Semi-conductive properties of passive films formed on copper in chromate solutions
Introduction
Copper is a key material in microelectronics because of its superior electronic conductivity and low electro-migration resistance. Superior corrosion resistance results from thin passive films formed on copper, which can prevent the further occurrence of corrosion process on its surface [1], [2], [3]. Generally, passive films formed on metals or alloys exhibit semi-conductive properties. Investigations on the semi-conductive properties of the passive films can provide some insights into the electronic properties of the passive films, which can be related to the mechanisms of the films formation, breakdown and dissolution. Since the films formation, breakdown and dissolution are tightly related to the corrosion process, many researches have been investigated on the semi-conductive properties of passive films to acquire more corrosion information [4], [5], [6], [7], [8], [9], [10]. Hence, it is necessary to understand the semi-conductive properties of passive films formed on these metals or alloys (including copper) in order to improve the corrosion resistance of metals or alloys.
Previous studies have been performed at oxide films formed on copper under anodic conditions. It shows that the reaction of the copper with its aqueous environment is very complex, and both soluble and insoluble products consist of two different oxidation states, Cu (I) and Cu (II) depending upon the applied potential. Millet B and his co-workers [11] have reported a duplex Cu2O films formed on copper after a long period of time in aerated and in the NaCl solutions, which are made of two semi-conductive components of different stoichiometries, p-type and n-type semiconductors. Arivial et al. [12] demonstrated the detailed mechanism for the electrochemical reactions of copper in alkaline solutions, and modifications of the reduction potential of cuprous oxide have been related to the conditions of the anodic potential sweep. However, only few papers available in the literature concerning the semi-conductive properties of passive films formed on copper in chromate solutions. In the present work, the semi-conductive properties of passive films formed on copper in chromate solutions were studied by using capacitance measurement. The effects of film formation potential and temperature, chloride and chromate concentration in electrolyte solution, as well as measured frequency on the semi-conductive properties of the films were examined.
Section snippets
Sample preparations
The samples were prepared by melting weighed mixtures of pure copper (99.95 wt.%) in an electric furnace, nitrogen gas was pulled on the molten surface to protect the oxidation. The molten copper was poured into a copper mould of 500 K in the atmosphere to form the rod (Φ 20 × 200 mm). Then the ultra-fine grained (UFG) coppers were processed by equal channel angular pressing (ECAP) with up to 4 passes at room temperature using route C with a rotation of 180° between passes [13]. A transmission
Mott-Schottky analysis
In general, oxide films formed on metals or alloys display n-type or p-type semi-conductive characters, the oxide films have a forbidden band of 1∼4 eV [14]. The Mott-Schottky analysis is often used to illustrate the semi-conductive properties of passive films by measuring the electrode capacitance as a function of the potential (E). Assuming that the capacitance of the space charge layer (C) is much less than that of the Helmholtz layer, then, the charge distribution at the
Polarization curves
Fig. 2 shows the polarization curve of UFG copper in 0.001 M chromate solutions. It can be seen that copper is in a stable passive state in the potential region from − 0.50 V to 0.48 V and exhibits good corrosion resistance property in 0.001 M chromate solutions. In addition, a peak appears when the potential reached to about 0.05 V. It may be related to the oxidation of Cu (I) to Cu (II) under this potential. The passive current change can affect the Mott-Schottky plots of passive films at peak
Conclusions
The results obtained in this study indicate that copper is in a stable passive state over the potential range from − 0.50 to 0.48 V in 0.001 M chromate solutions. From capacitance measurements (Mott-Schottky plots), the anodic passive films formed on copper in chromate solutions appear to have n-type semi-conductive properties and copper exist in two different oxidation states, Cu (I) and Cu (II). The Mott-Schottky plots of the films are frequency dependent and C− 2 increased with increasing
Acknowledgements
This work was financially supported by National high technology research and development program of China (863 plan) (Grant No. 2002AA331110) and by the doctorial foundation of Xi'an Jiaotong University (Grant No. DFXJTU 2003-4).
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