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Conducting cracks in dissimilar piezoelectric media

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Abstract

Complete stress and electric fields near the tip of a conducting crack between two dissimilar anisotropic piezoelectric media, are obtained in terms of two generalized bimaterial matrices proposed in this paper. It is shown that the general interfacial crack-tip field consists of two pairs of oscillatory singularities. New definitions of real-valued stress and electric field intensity factors are proposed. Exact solutions of the stress and electric fields for basic interface crack problems are obtained. An alternate form of the J integral is derived, and the mutual integral associated with the J integral is proposed. Closed form solutions of the stress and electric field intensity factors due to electromechanical loading and the singularities for a semi-infinite crack as well as for a finite crack at the interface between two dissimilar piezoelectric media, are also obtained by using the mutual integral.

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Authors and Affiliations

  1. Department of Mechanical Engineering, College of Engineering, Chonnam National University, 300 Yongbong-dong, Gwangju, 500-757, Korea E-mail

    H.G. Beom

  2. Center for Aerospace Research & Education, University of California at Los Angeles, 7704 Boelter Hall, School of Engineering and Applied Science, Los Angeles, CA, 90095-1600, USA

    S.N. Atluri

Authors
  1. H.G. Beom
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  2. S.N. Atluri
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Correspondence to H.G. Beom.

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Beom, H., Atluri, S. Conducting cracks in dissimilar piezoelectric media. International Journal of Fracture 118, 285–301 (2002). https://doi.org/10.1023/A:1023381215338

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