Abstract
A simulation methodology for the synthesis of polycrystalline, ionic thin films is developed. The method involves the preparation of a polycrystalline substrate onto which a thin film is subsequently grown by crystallization from the melt. A detailed structural analysis of a textured sixteen-grain FeO film, with a grain size of approximately 4.7 nm, shows that the interiors of the grains are almost perfect single crystals with only a very few vacancies and no interstitials. The grains are delineated by 〈001〉 tilt grain boundaries; as expected, the low-angle grain boundaries in the film consist of arrays of dislocations, while the high-angle grain boundaries are relatively narrow and well ordered.
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Phillpot, S., Keblinski, P., Wolf, D. et al. Synthesis and Characterization of a Polycrystalline Ionic Thin Film by Large-Scale Molecular-Dynamics Simulation. Interface Science 7, 15–31 (1999). https://doi.org/10.1023/A:1008782230777
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DOI: https://doi.org/10.1023/A:1008782230777