Abstract
Temperature dependent electron beam induced current (EBIC) technique has been applied to investigate the electrical activities of grain boundaries (GBs) in polycrystalline silicon. The GB character, misorientation and orientation of GB plane, were analyzed using a FE-SEM/EBSP/OIM system prior to the EBIC measurements. The EBIC contrasts were found to depend on GB character; low ΣGBs showed weak contrasts compared with general GBs at any temperatures, and also demonstrated to vary at GB irregularities such as boundary steps. These results indicate that electrical properties depend on the orientation of the GB plane as well as the misorientation. On the other hand, there existed less differences in temperature dependence of EBIC contrast irrespective of GB characters. The EBIC contrast decreased with increasing temperature, showed a minimum around 250 K, then increased again with further increasing temperature. The resulting temperature dependence of EBIC contrast probably comes from the combination of two types of recombination processes of carriers. One is related to a shallow level associated with an inherent GB structure, though the exact energy levels also would probably depend on GB structures, and the other to a deep level associated with impurities segregated at GBs, which acts as recombination center.
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Wang, ZJ., Tsurekawa, S., Ikeda, K. et al. Relationship between Electrical Activity and Grain Boundary Structural Configuration in Polycrystalline Silicon. Interface Science 7, 197–205 (1999). https://doi.org/10.1023/A:1008796005240
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DOI: https://doi.org/10.1023/A:1008796005240