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X-ray Diffraction Study of Mixed-Layer Compounds in the PbTe–Bi2Te3System

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Inorganic Materials Aims and scope

Abstract

PbTe–Bi2Te3alloys were studied by x-ray diffraction (XRD) and microstructural analysis. Single-crystal XRD studies of cleaved surfaces showed that the PbTe–Bi2Te3system contains an nPbTe · mBi2Te3homologous series of layered compounds with n= 1, 2 and m= 1–4. In addition to the known compounds PbBi2Te4and PbBi4Te7 , three new layered compounds with n/m< 1 were identified: PbBi6Te10(n= 1,m= 3), PbBi8Te13(n= 1, m= 4), and Pb2Bi6Te11(n= 2,m= 3). The 51-layer structure of PbBi6Te10was refined by single-crystal XRD (positional and thermal parameters, bond distances). No mixed-layer compounds with n/m> 1 were identified in the PbTe–Bi2Te3system, in contrast to GeTe–Bi2Te3and GeTe–Sb2Te3 .

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Authors and Affiliations

  1. Baikov Institute of Metallurgy and Materials Research, Russian Academy of Sciences, Leninskii pr. 49, Moscow, 117334, Russia

    O. G. Karpinskii, L. E. Shelimova, E. S. Avilov, M. A. Kretova & V. S. Zemskov

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  1. O. G. Karpinskii
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  2. L. E. Shelimova
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  3. E. S. Avilov
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  4. M. A. Kretova
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  5. V. S. Zemskov
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Karpinskii, O.G., Shelimova, L.E., Avilov, E.S. et al. X-ray Diffraction Study of Mixed-Layer Compounds in the PbTe–Bi2Te3System. Inorganic Materials 38, 17–24 (2002). https://doi.org/10.1023/A:1013639108297

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