Issue 24, 2003
From the journal:

Chemical Communications

Probe beam deflection study of ion exchange in self-assembled redox polyelectrolyte thin films

Doris E. Grumelli,a   Alejandro Wolosiuk,a   Erica Forzani,a   Gabriel A. Planes,b   César Barberob  and  Ernesto J. Calvo*a  

* Corresponding authors

a INQUIMAE-Departamento de Química Inorgánica, Analítica y Química Física, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Pabellón 2, Ciudad Universitaria, AR-1428 Buenos Aires, Argentina
E-mail: calvo@qi.fcen.uba.ar
Fax: 54 1145763341
Tel: 54 1145763378

b Departamento de Química, Universidad Nacional de Río Cuarto (UNRC), Agencia Postal No. 3, AR-5800 Río Cuarto, Argentina
E-mail: cbarbero@exa.unrc.edu.ar
Fax: 54 3584676233
Tel: 54 3584676157

Abstract

Probe beam deflection during chronoamperometric oxidation–reduction of osmium complex in layer-by-layer self-assembled redox active polyelectrolyte multilayers has shown that the nature of the charge in the topmost layer determines the ion flux that balances the redox charge.

Graphical abstract: Probe beam deflection study of ion exchange in self-assembled redox polyelectrolyte thin films

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Article information

DOI
https://doi.org/10.1039/B308449C
Article type
Communication
Submitted
04 Sep 2003
Accepted
16 Oct 2003
First published
07 Nov 2003

Chem. Commun., 2003, 3014-3015

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Probe beam deflection study of ion exchange in self-assembled redox polyelectrolyte thin films

D. E. Grumelli, A. Wolosiuk, E. Forzani, G. A. Planes, C. Barbero and E. J. Calvo, Chem. Commun., 2003, 3014 DOI: 10.1039/B308449C

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