Issue 10, 2006

Chemical vapour deposition of II–VI semiconductor thin films using M[(TePiPr2)2N]2 (M = Cd, Hg) as single-source precursors

Abstract

The aerosol-assisted chemical vapour deposition (AACVD) of CdTe has been carried out using Cd[(TePiPr2)2N]2 at substrate temperatures between 375 and 475 °C. XRD shows the formation of cubic CdTe between 425 and 475 °C. At low deposition temperature (375 °C), a mixture of hexagonal tellurium and cubic cadmium telluride is observed. SEM images reveal that the growth temperatures do not have a profound effect on the morphologies of films. Surface analysis by XPS of films deposited at 475 °C showed the growth of Te-rich films. The AACVD of Hg[(TePiPr2)2N]2 resulted in deposition of hexagonal tellurium.

Graphical abstract: Chemical vapour deposition of II–VI semiconductor thin films using M[(TePiPr2)2N]2 (M = Cd, Hg) as single-source precursors

Article information

Article type
Paper
Submitted
28 Oct 2005
Accepted
18 Nov 2005
First published
05 Dec 2005

J. Mater. Chem., 2006,16, 966-969

Chemical vapour deposition of II–VI semiconductor thin films using M[(TePiPr2)2N]2 (M = Cd, Hg) as single-source precursors

S. S. Garje, J. S. Ritch, D. J. Eisler, M. Afzaal, P. O'Brien and T. Chivers, J. Mater. Chem., 2006, 16, 966 DOI: 10.1039/B515362J

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