Issue 8, 2001

Abstract

Dielectric relaxations in ferroelectric ceramics occur at various frequencies, depending on the type of chemical or physical defects. These defects depend on either intrinsic or extrinsic heterogeneities due to special heat treatments (quenching, annealing,…), ionic substitutions, grain size additives, and grain boundary nature. The value of the relaxation frequency fr increases from about 102 to 1012 Hz as the scale of the defect phenomenon decreases from microstructure, to nanostructure, to unit-cell, to atomic vibrations. This type of study requires a pluridisciplinary approach involving solid state chemistry, materials science, solid state physics and various industrial aspects. The applications in the area of electronic ceramics are related to the value of fr. In absorbants, the usable frequency is close to fr, whereas it is far from fr in good insulators. In view of numerous experimental examples, a classification is proposed to predict which materials may be suitable for a given application.

Article information

Article type
Feature Article
Submitted
19 Dec 2000
Accepted
26 Apr 2001
First published
14 Jun 2001

J. Mater. Chem., 2001,11, 1957-1967

Ferroelectric ceramics: defects and dielectric relaxations

C. Elissalde and J. Ravez, J. Mater. Chem., 2001, 11, 1957 DOI: 10.1039/B010117F

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