Issue 6, 2002
From the journal:

Journal of Materials Chemistry

Wen Chen,*a   Qing Xu,a   Yong Sheng Hu,a   Li Qiang Maia  and  Quan Yao Zhua  

* Corresponding authors

a Institute of Materials Science and Engineering, Wuhan University of Technology, Wuhan, Hubei, People's Republic of China
E-mail: CHENW@public.wh.hb.cn
Fax: +86-27-87642079
Tel: +86-27-87864033

Abstract

V2O5 xerogel films modified by poly(ethylene oxide) (PEO) were obtained via the sol–gel method. Investigations were conducted by X-ray diffractometry (XRD), Fourier transformation infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS) and cyclic voltammetry. The results show that when the V2O5 xerogel is modified by the intercalation of PEO, the H atoms in PEO are hydrogen-bonded with the O atoms of the V[double bond, length as m-dash]O bonds of the V2O5 xerogel, which effectively shielded against electrostatic interactions between the V2O5 interlayer and Li+ ions. The reversibility of insertion/extraction of Li+ ions is greatly improved by modification of the V2O5 xerogel with PEO.

Graphical abstract: Effect of modification by poly(ethylene oxide) on the reversibility of insertion/extraction of Li+ ion in V2O5 xerogel films

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Article information

DOI
https://doi.org/10.1039/B203056J
Article type
Paper
Submitted
26 Mar 2002
Accepted
02 Apr 2002
First published
26 Apr 2002

J. Mater. Chem., 2002,12, 1926-1929

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Effect of modification by poly(ethylene oxide) on the reversibility of insertion/extraction of Li+ ion in V2O5 xerogel films

W. Chen, Q. Xu, Y. S. Hu, L. Q. Mai and Q. Y. Zhu, J. Mater. Chem., 2002, 12, 1926 DOI: 10.1039/B203056J

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