Issue 8, 2005
From the journal:

Journal of Analytical Atomic Spectrometry

Inclusion mapping and estimation of inclusion contents in ferrous materials by fast scanning laser-induced optical emission spectrometry

Heinz-Martin Kuss,a   Horst Mittelstaedtb  and  Gregor Mueller†*a  

* Corresponding authors

a University Duisburg-Essen, Department of Instrumental Analytical Chemistry, Lotharstrasse 1, D-47057 Duisburg, Germany
E-mail: gregor.mueller@thyssenkrupp.com
Fax: +41 1 823 4034
Tel: +41 1 823 4606

b ThyssenKrupp Stahl AG, Werkstoffkompetenzzentrum, Kaiser-Wilhelm-Strasse 100, D-47166 Duisburg, Germany

Abstract

Fast scanning laser-induced optical emission spectrometry (scanning laser OES) is applied to estimate the content of non-metallic inclusions in ferrous materials within a few tens of minutes. The emission intensity after each single laser pulse is recorded in 41 element channels. Signals of inclusion related elements are evaluated by different statistical algorithms. The goal of the data treatment is to distinguish between emission peaks representing laser pulses focussed on the non-metallic inclusions and the class of low intensity signals from the element share dissolved in the metallic matrix. Criteria for the distinction are the 3-sigma (plus mean) threshold, the skewness of the histogram by Pearson, and a modified outlier test based on the Nalimov test. Correlations between the statistical approaches for signal evaluation and the inclusion contents in synthetic Fe-base standards are discussed.

Graphical abstract: Inclusion mapping and estimation of inclusion contents in ferrous materials by fast scanning laser-induced optical emission spectrometry

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Article information

DOI
https://doi.org/10.1039/B503277F
Article type
Paper
Submitted
04 Mar 2005
Accepted
31 May 2005
First published
17 Jun 2005

J. Anal. At. Spectrom., 2005,20, 730-735

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Inclusion mapping and estimation of inclusion contents in ferrous materials by fast scanning laser-induced optical emission spectrometry

H. Kuss, H. Mittelstaedt and G. Mueller, J. Anal. At. Spectrom., 2005, 20, 730 DOI: 10.1039/B503277F

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