Issue 42, 2009
From the journal:

Physical Chemistry Chemical Physics

A novel pulse isotopic exchange technique for rapid determination of the oxygen surface exchange rate of oxide ion conductors†

Henny J. M. Bouwmeester,*a   Chunlin Song,a   Jianjun Zhu,a   Jianxin Yi,a   Martin van Sint Annalanda  and  Bernard A. Boukampa  

* Corresponding authors

a Faculty of Science and Technology, MESA+ Institute for Nanotechnology & IMPACT Institute of Mechanics, Processes and Control Twente, University of Twente, P.O. Box 217, Enschede, The Netherlands
E-mail: h.j.m.bouwmeester@tnw.utwente.nl
Fax: +31 (0)53 489 2202

Abstract

We demonstrate the use of a novel pulse 18O–16O isotopic exchange technique for the rapid determination of the oxygen surface exchange rate of oxide ion conductors while simultaneously providing insight into the mechanism of the oxygen exchange reaction, which contributes to the efficient development of devices incorporating these solids, such as solid oxide fuel cells and oxygen transport membranes.

Graphical abstract: A novel pulse isotopic exchange technique for rapid determination of the oxygen surface exchange rate of oxide ion conductors

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Article information

DOI
https://doi.org/10.1039/B912712G
Article type
Communication
Submitted
26 Jun 2009
Accepted
18 Aug 2009
First published
26 Aug 2009

Phys. Chem. Chem. Phys., 2009,11, 9640-9643

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A novel pulse isotopic exchange technique for rapid determination of the oxygen surface exchange rate of oxide ion conductors

H. J. M. Bouwmeester, C. Song, J. Zhu, J. Yi, M. van Sint Annaland and B. A. Boukamp, Phys. Chem. Chem. Phys., 2009, 11, 9640 DOI: 10.1039/B912712G

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