Issue 20, 2012
From the journal:

Nanoscale

Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope†

Sangmin An,a   Corey Stambaugh,‡a   Gunn Kim,b   Manhee Lee,§a   Yonghee Kim,a   Kunyoung Leea  and  Wonho Jhe*a  

* Corresponding authors

a Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, Republic of Korea
E-mail: whjhe@snu.ac.kr
Fax: +82 2 886-5786
Tel: +82 2 880-6600

b Department of Physics and Graphene Research Institute, Sejong University, 98 Gunja-Dong, Gwangjin-Gu, Seoul 143-747, Republic of Korea

Abstract

Electric-field-induced low-volume liquid ejection under ambient conditions was realized at a low bias potential of 12 V via a nanopipette (aperture diameter of 30 nm) combined with a non-contact, distance-regulated (within 10 nm) quartz tuning fork-atomic force microscope. A capillary-condensed water meniscus, spontaneously formed in the tip–substrate nanogap, reduces the ejection barrier by four orders of magnitude, facilitating nanoliquid ejection and subsequent liquid transport/dispersion onto the substrate without contact damage from the pipette. A study of nanofluidics through a free-standing liquid nanochannel and nanolithography was performed with this technique. This is an important breakthrough for various applications in controlled nanomaterial-delivery and selective deposition, such as multicolor nanopatterning and nano-inkjet devices.

Graphical abstract: Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope

About
Cited by
Related
Download options Please wait...

Supplementary files

Article information

DOI
https://doi.org/10.1039/C2NR30972F
Article type
Paper
Submitted
23 Apr 2012
Accepted
09 Aug 2012
First published
15 Aug 2012

Nanoscale, 2012,4, 6493-6500

Permissions

Request permissions

Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope

S. An, C. Stambaugh, G. Kim, M. Lee, Y. Kim, K. Lee and W. Jhe, Nanoscale, 2012, 4, 6493 DOI: 10.1039/C2NR30972F

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements