Abstract
xHfO2–(100 − x) SiO2 (x = 10, 20, 30 mol%) glass-ceramic planar waveguides doped with 0.3 mol% Er3+ ions, prepared by the sol–gel route and heat treated at 1000 °C to nucleate HfO2 crystals, were analysed by x-ray photoelectron spectroscopy, x-ray diffraction, high resolution transmission electron microscopy and photoluminescence spectroscopy. Formation of tetragonal HfO2 nanocrystals has been evidenced in all the samples. Spectroscopic parameters concerning the 4I13/2 metastable state of Er3+ion are revisited as a function of XPS analysis.
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