Scanning tunnelling spectroscopy characterization of ZnO single crystals

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Published under licence by IOP Publishing Ltd
, , Citation A Urbieta et al 2001 Semicond. Sci. Technol. 16 589 DOI 10.1088/0268-1242/16/7/311

0268-1242/16/7/589

Abstract

Bulk ZnO single crystals grown by the hydrothermal and flux methods have been characterized by scanning tunnelling spectroscopy performed in the different crystalline faces. Normalized differential conductance has been found to depend on the face considered. Polar O-terminated surfaces show an intrinsic conduction behaviour and surface bandgap in the range 0.4-0.8 eV, which depends on the position probed. The Zn polar surfaces show mainly n-type conduction. The non-polar m regions present either intrinsic or p-type behaviour. The differences observed are attributed to the nature of impurities and defects appearing in the polar and non-polar surfaces during crystal growth.

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