Abstract
The results of heat flux measurements using a sensor based on anisotropic thermoelements with defects in the crystal structure during reflection of a shock wave are presented. Using numerical simulation, the influence of the defective layer thickness on the sensor electrical signal and the calculated heat flux is analysed. It is shown that the presence of even a thin defect layer makes it unsuitable for measuring pulsed heat fluxes with a characteristic time of ∼ 1 μs.
Export citation and abstract BibTeX RIS
Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.