Electrical properties of evaporated CdSe films

The electrical properties, viz resistivity and I-V characteristics, of evaporated CdSe films sandwiched between two Al electrodes have been studied in situ at 30 degrees C and at 8*10^-6 Torr within the thickness range of 2400-2500 AA as function of substrate temperature (50-150 degrees C). The observed change in resistivity in I-V characteristics could be explained by stoichiometric changes of the film material and film disorder of thermally evaporated films. Space-charge-limited current conduction was observed on films prepared at a substrate temperature of 150 degrees C.