Characterization of butterfly single crystals of by atomic force, optical and scanning electron microscopy techniques

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Published under licence by IOP Publishing Ltd
, , Citation Geoffrey K H Pang and K Z Baba-Kishi 1998 J. Phys. D: Appl. Phys. 31 2846 DOI 10.1088/0022-3727/31/20/019

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1 The Hong Kong Polytechnic University, Department of Applied physics, HungHom, Kowloon, Hong Kong, People's Republic of China

Dates

  1. Received 1 May 1998

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0022-3727/31/20/2846

Abstract

A comparative study of ferroelectric domain configurations and surface morphology of butterfly single crystals of by the techniques of atomic force microscopy, optical microscopy and scanning electron microscopy is described. An unusual array of defects on the surface of a highly stressed region of the crystal was investigated in detail. Surface microstructural features displaying complex and distinct morphology associated with barium-rich phases were also studied.

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10.1088/0022-3727/31/20/019