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This special section of Measurement Science and Technology focuses on the 18th International Metrology Congress (CIM 2017), held in Paris, France, on 19 to 21 September 2017.
The International Metrology Congress is a unique crossroads between R&D and industrial applications for all actors and all fields: from industrial end-users of measurement equipment, technical experts, public and private laboratories, to manufacturers and service providers.
The Congress aimed to improve measurement, analysis and test processes, whilst reducing any inherent risks, and to explore evolutions in measurement techniques, advances in R&D and their application for industry.
The highlight of CIM 2017 was 'Measure and Create the Future', and the major metrological institutes delivered lectures about the revision of the SI and R&D metrology at the European level during the plenary session.
All 180 presentations dealt with processes (measurement uncertainties, mathematical models, training, metrology in medical laboratories, etc), techniques (flow, electricity, temperature, dimensional and 3D, optics, etc) and perspectives in energy, artificial intelligence and data, nanotechnologies, metrology 4.0, among others.
Six industrial round-tables were also scheduled in the programme: New ISO/IEC 17025, Metrology for the Pharmaceutical Industry, Measurement for Water Quality, Dynamic Measurement and Factory of the Future, Drone-based Inspection, and Progress for Measurement at Nanoscale.
During the closing session, Mrs Sautter from the National Museum of Natural History, mineralogist and NASA's collective awards in 2014 and CNRS silver medal in 2016, presented an invited lecture about the instrumentation of the Rover Curiosity working on Mars.
The Congress is organised by the Collège Français de Métrologie in partnership with Euramet, the European co-operation for Accreditation, the BIPM, the OIML, the NCSLi, the NPL and the FPS Economy for international participation. The end-users, the professionals and the academics completed the organisation: A3P, Afnor Normalisation, BEA Metrology, CETIAT, Cofrac, Hexagon Manufacturing Intelligence, Implex, LNE, Metro-Logix, PSA Group, Rolls Royce, Trescal, STIL, the University of Burgundy and Wika.
The main partner of the CIM 2017 was TRESCAL. Its other sponsors were CETIAT, Hexagon Manufacturing Intelligence, Implex and Polyworks Europa. The Ministry in charge of the Economy and the Ministry of Culture also supported the event.
The CIM 2017 was co-organised with ENOVA, the major trade show in France dedicated to technologies in electronics, IoT, measurement, vision and optics.
This special section includes thirteen papers covering new scientific and technological aspects and that are representative of the topics of the event.