Abstract
Eu-doped lutetium oxide (Lu2O3:Eu) is one of the densest known scintillator and was reported to have high-conversion efficiency. It is therefore an excellent candidate scintillator to improve the efficiency of high-spatial resolution X-ray imaging detectors at high X-ray energies. The first results of the development of single crystal thin films using the liquid phase epitaxy technique are reported. Several films with thickness in the range 0.5-22 μm were grown and characterized using X-ray diffraction and electron microscopy techniques. The images performances of these films when used as converter screens for X-ray detectors are also presented.
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