Electronic, thermal, and elastic properties of Ti3Si1xGexC2 solid solutions

P. Finkel, B. Seaman, K. Harrell, J. Palma, J. D. Hettinger, S. E. Lofland, A. Ganguly, M. W. Barsoum, Z. Sun, Sa Li, and R. Ahuja
Phys. Rev. B 70, 085104 – Published 10 August 2004

Abstract

In this paper we report on the electronic, elastic, and thermal properties of Ti3Si1xGexC2. The conductivities, Hall coefficients, and magnetoresistances are analyzed within a two-band framework assuming temperature-independent charge carrier concentrations. In this framework, Ti3Si1xGexC2 is shown to be a compensated material, i.e., the concentration of electrons is nearly equal to that of the holes. Aside from effects of solid solution scattering at low temperature, there appears to be surprisingly little effect on any of the physical properties due to Ge substitution, with the exception of the thermal expansion, which is smallest in x=1.

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  • Received 18 December 2003

DOI:https://doi.org/10.1103/PhysRevB.70.085104

©2004 American Physical Society

Authors & Affiliations

P. Finkel*, B. Seaman, K. Harrell, J. Palma, J. D. Hettinger, and S. E. Lofland

  • Department of Physics and Astronomy, Rowan University, Glassboro, New Jersey 08028, USA

A. Ganguly and M. W. Barsoum

  • Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104, USA

Z. Sun

  • Materials Chemistry, RWTH Aachen, Aachen, Germany

Sa Li and R. Ahuja

  • Department of Physics, Uppsala University, Uppsala, Sweden

  • *Current address: Thomson TWW Lancaster R&D Center, Lancaster, PA 17601.

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Vol. 70, Iss. 8 — 15 August 2004

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