Tunneling-percolation origin of nonuniversality: Theory and experiments

Sonia Vionnet-Menot, Claudio Grimaldi, Thomas Maeder, Sigfrid Strässler, and Peter Ryser
Phys. Rev. B 71, 064201 – Published 16 February 2005

Abstract

A vast class of disordered conducting-insulating compounds close to the percolation threshold is characterized by nonuniversal values of transport critical exponent t, in disagreement with the standard theory of percolation which predicts t2.0 for all three-dimensional systems. Various models have been proposed in order to explain the origin of such universality breakdown. Among them, the tunneling-percolation model calls into play tunneling processes between conducting particles which, under some general circumstances, could lead to transport exponents dependent of the mean tunneling distance a. The validity of such theory could be tested by changing the parameter a by means of an applied mechanical strain. We have applied this idea to universal and nonuniversal RuO2-glass composites. We show that when t>2 the measured piezoresistive response Γ, i.e., the relative change of resistivity under applied strain, diverges logarithmically at the percolation threshold, while for t2, Γ does not show an appreciable dependence upon the RuO2 volume fraction. These results are consistent with a mean tunneling dependence of the nonuniversal transport exponent as predicted by the tunneling-percolation model. The experimental results are compared with analytical and numerical calculations on a random-resistor network model of tunneling percolation.

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  • Received 25 July 2004

DOI:https://doi.org/10.1103/PhysRevB.71.064201

©2005 American Physical Society

Authors & Affiliations

Sonia Vionnet-Menot1, Claudio Grimaldi1,*, Thomas Maeder1,2, Sigfrid Strässler1,2, and Peter Ryser1

  • 1Laboratoire de Production Microtechnique, Ecole Polytechnique Fédérale de Lausanne, Station 17, CH-1015 Lausanne, Switzerland
  • 2Sensile Technologies SA, PSE, CH-1015 Lausanne, Switzerland

  • *Electronic address: claudio.grimaldi@epfl.ch

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Issue

Vol. 71, Iss. 6 — 1 February 2005

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