Doping and the Fermi Energy in Amorphous Silicon

R. A. Street
Phys. Rev. Lett. 49, 1187 – Published 18 October 1982
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Abstract

The doping of hydrogenated amorphous silicon is discussed within the context of Mott's 8N rule, and found to have properties distinctly different from dopants in crystalline silicon. A unifying description of dopant and defect states based on the position of the Fermi energy is given. Some possible consequences of the 8N rule for the deposition and structure of a-Si: H are also discussed.

  • Received 23 August 1982

DOI:https://doi.org/10.1103/PhysRevLett.49.1187

©1982 American Physical Society

Authors & Affiliations

R. A. Street

  • Xerox Palo Alto Research Center, Palo Alto, California 94304

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Issue

Vol. 49, Iss. 16 — 18 October 1982

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