Frequency Dependence of Shot Noise in a Diffusive Mesoscopic Conductor

R. J. Schoelkopf, P. J. Burke, A. A. Kozhevnikov, D. E. Prober, and M. J. Rooks
Phys. Rev. Lett. 78, 3370 – Published 28 April 1997
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Abstract

Detailed measurements of the voltage, temperature, and frequency dependence of the nonequilibrium current fluctuations for a diffusive mesoscopic conductor are reported. The data confirm predictions that a mesoscopic conductor shorter than the electron-electron inelastic length will display shot noise. Furthermore, the low temperatures (100 mK) and high frequencies (1–20 GHz) used for the measurements allow tests in the high-frequency regime (i.e., hνeV and kT) of the shot noise, which clearly show the influence of vacuum fluctuations. The quantum noise causes a high-frequency “cutoff” in the shot noise, i.e., the noise is independent of bias voltage for frequencies ν>eV/h.

  • Received 22 November 1996

DOI:https://doi.org/10.1103/PhysRevLett.78.3370

©1997 American Physical Society

Authors & Affiliations

R. J. Schoelkopf, P. J. Burke, A. A. Kozhevnikov, and D. E. Prober

  • Departments of Applied Physics and Physics, Yale University, New Haven, Connecticut 06520-8284

M. J. Rooks

  • Cornell Nanofabrication Facility, Knight Laboratory, Cornell University, Ithaca, New York 14853

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Vol. 78, Iss. 17 — 28 April 1997

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