Barriers to carrier transport in multiple quantum well nitride-based c-plane green light emitting diodes

Cheyenne Lynsky, Abdullah I. Alhassan, Guillaume Lheureux, Bastien Bonef, Steven P. DenBaars, Shuji Nakamura, Yuh-Renn Wu, Claude Weisbuch, and James S. Speck
Phys. Rev. Materials 4, 054604 – Published 26 May 2020
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Abstract

The presence of alloy disorder in III-nitride materials has been demonstrated to play a significant role in device performance through effects such as carrier localization and carrier transport. Relative to blue light emitting diodes (LEDs), these effects become more severe at green wavelengths. Because of the potential fluctuations that arise due to alloy disorder, full three-dimensional (3D) simulations are necessary to accurately relate materials properties to device performance. We demonstrate experimentally and through simulation that increased quantum well (QW) number in c-plane green LEDs contributes to excess driving voltage, and therefore reduced electrical efficiency. Experimentally, we grew an LED series with the number of QWs varying from one to seven and observed a systematic increase in voltage with the addition of each QW. Trends in LED electrical properties obtained from 3D simulations, which account for the effects of random alloy fluctuations, are in agreement with experimental data. Agreement is achieved without the need for adjusting polarization parameters from their known values. From these results, we propose that the polarization induced barriers at the GaN/InGaN (lower barrier/QW) interfaces and the sequential filling of QWs both contribute significantly to the excess forward voltage in multiple QW c-plane green LEDs.

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  • Received 5 December 2019
  • Revised 14 February 2020
  • Accepted 9 April 2020

DOI:https://doi.org/10.1103/PhysRevMaterials.4.054604

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Cheyenne Lynsky1,*, Abdullah I. Alhassan1,2,*, Guillaume Lheureux1,*, Bastien Bonef1, Steven P. DenBaars1, Shuji Nakamura1, Yuh-Renn Wu3, Claude Weisbuch1,4, and James S. Speck1

  • 1Materials Department, University of California, Santa Barbara, California 93106, USA
  • 2National Center for Nanotechnology, King Abdulaziz City for Science and Technology (KACST), Riyadh 11442, Kingdom of Saudi Arabia
  • 3Graduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan
  • 4Laboratoire de Physique de la Matière Condensée, CNRS, IP Paris, Ecole Polytechnique, 91128 Palaiseau Cedex, France

  • *These authors contributed equally to this work.

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Issue

Vol. 4, Iss. 5 — May 2020

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