Abstract
The density of random dislocations in germanium and silicon crystals has been measured by means of x-ray rocking curves and by etch pit counting. Data obtained by the two methods are in good agreement, and dislocation densities in the range -/ were found. The minority carrier lifetime was shown to vary with the dislocation density, and the results could be expressed in terms of a recombination efficiency per unit length of dislocation line, (where , ). was found to decrease with increasing resistivity of germanium and was higher for silicon than for germanium of comparable purity.
- Received 7 November 1955
DOI:https://doi.org/10.1103/PhysRev.101.1285
©1956 American Physical Society