Penetration of Electrons in Aluminum Oxide Films

J. R. Young
Phys. Rev. 103, 292 – Published 15 July 1956
PDFExport Citation

Abstract

The practical range of low-energy electrons in thin Al2O3 films has been measured. Films ranging in thickness from 85 to 5000 A were investigated. Results are in close agreement with the predictions of Bethe and the results obtained by Hoffman for 1000-3000 A Al2O3 films. The practical range-energy relation obtained was found to be R=0.0115E1.35, where R is expressed in mg/cm2 and E in kev.

  • Received 11 April 1956

DOI:https://doi.org/10.1103/PhysRev.103.292

©1956 American Physical Society

Authors & Affiliations

J. R. Young

  • General Electric Research Laboratory, Schenectady, New York

References (Subscription Required)

Click to Expand
Issue

Vol. 103, Iss. 2 — July 1956

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Journals Archive

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×