Abstract
The drift mobility of holes in -type silicon and electrons in -type silicon has been measured as functions of impurity concentration and temperature. In single crystals of resistivity greater than 10 ohm-centimeter, the mobility at 300°K of holes is /volt-sec and of electrons is /volt-sec. For this high-resistivity material, the temperature dependence of mobility in the same units is and .
- Received 4 December 1953
DOI:https://doi.org/10.1103/PhysRev.93.1204
©1954 American Physical Society