Abstract
We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.
- Received 20 January 2009
DOI:https://doi.org/10.1103/PhysRevA.80.040902
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