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Noninvasive electron microscopy with interaction-free quantum measurements

William P. Putnam and Mehmet Fatih Yanik
Phys. Rev. A 80, 040902(R) – Published 23 October 2009

Abstract

We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.

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  • Received 20 January 2009

DOI:https://doi.org/10.1103/PhysRevA.80.040902

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Authors & Affiliations

William P. Putnam and Mehmet Fatih Yanik*

  • Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

  • *yanik@mit.edu

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Issue

Vol. 80, Iss. 4 — October 2009

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