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Single-qubit-gate error below 104 in a trapped ion

K. R. Brown, A. C. Wilson, Y. Colombe, C. Ospelkaus, A. M. Meier, E. Knill, D. Leibfried, and D. J. Wineland
Phys. Rev. A 84, 030303(R) – Published 14 September 2011

Abstract

With a 9Be+ trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)×105, below the threshold estimate of 104 commonly considered sufficient for fault-tolerant quantum computing. The 9Be+ ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

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  • Received 18 May 2011

DOI:https://doi.org/10.1103/PhysRevA.84.030303

Published by the American Physical Society

Authors & Affiliations

K. R. Brown*, A. C. Wilson, Y. Colombe, C. Ospelkaus, A. M. Meier, E. Knill, D. Leibfried, and D. J. Wineland

  • National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305, USA

  • *kbrown@iontrapping.com; present address: Georgia Tech Research Institute, 400 10th Street Northwest, Atlanta, Georgia 30318, USA.
  • Present address: QUEST, Leibniz Universität Hannover, Im Welfengarten 1, D-30167 Hannover and PTB, Bundesallee 100, D-38116 Braunschweig, Germany.

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Vol. 84, Iss. 3 — September 2011

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