Theory of trap-controlled transient photoconduction

Fred W. Schmidlin
Phys. Rev. B 16, 2362 – Published 15 September 1977
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Abstract

An analytic solution of the "conventional" multiple-trapping problem is obtained for a small quantity of charge moving through a spatially varying, but time-independent, electric field and an arbitrary distribution of traps. The solution is shown to apply to cases of microscopic hopping as well as free-translation through extended states. The solution for a discrete set of traps, simply characterized by their mean times for capture and release (τi and τr,i, respectively) appears in the form of convolutions of modified Bessel functions of order unity, but for a uniform electric field and a continuum of traps satisfying the relation τi1=τr,iα with the τr,i uniformly spaced on a logarithmic scale, the solution reduces to a simple algebraic form which is identical to the one obtained by Scher and Montroll for their power-law waiting-time distribution function ψ(t)t(1+α). A general equivalence between trapping and continuous-time random walk (CTRW) is further established which shows that ψ(t) can always be constructed from capture and release kinetics, and vice versa. The new trapping solution (and its equivalence to CTRW) is illustrated by reinterpreting transit-time data on aAs2Se3. A trap density satisfying Niνiα1 for 1011<νi<1014 sec1 is obtained, where νi is the coefficient of τr,i=νi1exp(εikT) and εi=0.65 eV (for all traps) is the activation energy for release. With the plausible assumption that the microscopic mobility and capture processes are similarly activated (if at all), a trap density for the half-decade interval of νi around 7 × 1011 sec1 is found to satisfy (NiNν)=4×106μ0 (cm2/V sec), where Ni and Nν are concentrations of traps and transport states, respectively, and μ0 is the prefactor in μ=μ0exp(ΔμkT). Both hopping and extendedstate motion are compatible with these results, but the most plausible tentative view is hopping with Ni1013 cm3 and μ0=0.2 to 0.002 cm2/V sec. Additional photo- and dark-conduction data could significantly reduce the range of plausible values.

  • Received 13 January 1977

DOI:https://doi.org/10.1103/PhysRevB.16.2362

©1977 American Physical Society

Authors & Affiliations

Fred W. Schmidlin

  • Xerox Webster Research Center, Webster, New York 14580

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Issue

Vol. 16, Iss. 6 — 15 September 1977

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